SK. has filed a patent for an Entropy measurement method involving powering on an entropy source unit, emitting a quantum signal with classical and quantum noise, measuring noise statistics, calculating quantum noise, and controlling the entropy source unit based on the results. The method aims to ensure accurate entropy estimation. GlobalData’s report on SK gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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Quantum entropy measurement method for noise control in devices
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The patent application (Publication Number: US20240036828A1) describes an entropy measurement method that involves several steps to accurately measure entropy in a system. The method includes a start-up phase, signal emitting step, noise measurement step, entropy estimation step, health check step, and health control step. The classical noise and quantum noise are measured and compared to ensure the entropy source unit is functioning correctly. Additionally, the method includes steps for detecting classical noise through optical dark pixels, periodically turning on and off the light source for noise detection, and storing photon detection statistics in memory. The entropy estimation step calculates the entropy amount based on mean and variance values, which are used to determine the quality of entropy generated by the source.
Furthermore, the method includes provisions for indicating entropy quality drops to the user, blocking output of entropy bits in case of significant quality drops, and adjusting light intensity and exposure time of pixels to improve entropy generation. If continuous quality drops are detected, the system can undergo adjustments or a complete restart. The method also includes steps for informing the user when a repeated total failure is detected, indicating the end of the system's life. Additionally, the method involves ADC sensitivity modulation to reduce sensitivity when classical noise statistics exceed a threshold, which can occur before or after the entropy estimation step. Overall, the patent application outlines a comprehensive entropy measurement method with various checks and controls to ensure the reliability and functionality of the entropy source unit.
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